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Article Dans Une Revue New Journal of Physics Année : 2017

Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics

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Résumé

We quantitatively study interfacial adhesion in a two-layer membrane system consisting of Al and Siwith femtosecond time-resolved laser spectroscopy. High-frequency acoustic pulses in the sub-THz regime are utilized to characterize the membrane system. In order to explain the distinct features ofthe measured data, a spring model for the Al/Si interface is employed. We show that acousticdissipation in this system needs to be included for accurate modeling of the interface adhesion over abroad frequency range.

Dates et versions

hal-02536022 , version 1 (07-04-2020)

Identifiants

Citer

Martin Grossmann, Martin Schubert, Chuan He, Delia Brick, Elke Scheer, et al.. Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics. New Journal of Physics, 2017, 19 (5), pp.053019. ⟨10.1088/1367-2630/aa6d05⟩. ⟨hal-02536022⟩
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