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Article Dans Une Revue Thin Solid Films Année : 2011

Multiple glass transition temperatures of polymer thin films as probed by multi-wavelength ellipsometry

Résumé

Ellipsometry was used as a technique to determine glasstemperaturetransitions of homopolymer thinfilms of polystyrene and poly(methyl methacrylate) ranging from 5 to 200 nm. The technique operated systematically at various energies reveals the presence of multipletransitions in these films under certain conditions of preparation. It was observed that in the case of strong polymer-substrate interactions, several Tg were measured and ascribed to a layered structure in the film. In the absence of strong interactions, a more uniform film presenting a single Tg was observed no matter the thickness. The results confirm the recent assumption of thinfilms organised in multilayers and emphasize the importance of using a highly sensitive multi-wavelength technique in probing such properties.

Dates et versions

hal-00714987 , version 1 (06-07-2012)

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Abderrahim El Ouakili, Guillaume Vignaud, Eric Balnois, Jean-François Bardeau, Yves Grohens. Multiple glass transition temperatures of polymer thin films as probed by multi-wavelength ellipsometry. Thin Solid Films, 2011, 519 (6), pp.2031-2036. ⟨10.1016/j.tsf.2010.10.015⟩. ⟨hal-00714987⟩
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